Non-Linear Test Pattern Generation For Stuck At Fault Identification
Keywords:VLSI, Non linear feedback shift register, stuck at fault, Xilinx ISE.
For identifying the fault the test pattern generation is the major role in VLSI design. The pseudo random generator that is linear/Non linear shift register are utilized to produce the patterns and given the circuits. In this paper Non Linear Feedback shift registers are used over Automatic Test Pattern Generation to identify the Stuck at faults which offers less power compare to the conventional method with high fault coverage. The proposed method is simulated and verified using Xilinx ISE tool.
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